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SEMI International Standards
Standards Locale: North America
Committee: Metrics
Place of Meeting: SEMI Headquarters in San Jose, CA
Date of Meeting: 04/03/2013
Meeting End Date: 04/03/2013
Recording SEMI Standards Staff: Michael Tran
CER Posted to Web: 04/17/2013
Leadership Changes

Group
Previous Leader
New Leader
Wait Time Waste TFLance Rist (Industry Consultant), co-leader


TC Chapter Structure Changes
None.

Ballot Results
Passed ballots and line items will be submitted to the ISC Audit & Review Subcommittee for procedural review.
Failed ballots and line items were returned to the originating task forces for re-work and re-balloting.
Document #
Document Title
Committee Action
A&R Forms for Approved Ballots
5472
Revision to SEMI E43-1108, Recommended Practice for Electrostatic Measurements on Objects and Surfaces with title change to: Guide for Electrostatic Measurements on Objects and SurfacesPassed as balloted.5472ProceduralReview.doc
5525
Reapproval of SEMI E150-1107, Guide for Equipment Training Best Practices Failed committee review.5525ProceduralReviewFAILED.doc
5526
Line Item Revisions to SEMI E165-0712, Guide for Comprehensive Equipment Training Systems when Dedicated Training Equipment is not Available5526ProceduralReview.doc
Line Item 1
Revisions to Paragraph 5.2.1Passed as balloted. Superclean.
Line Item 2
Revisions to Paragraph 5.2.2Passed as balloted.
Superclean.


Ratification Ballot Results
None.

Activities Approved by the GCS between meetings of TC Chapter meeting
None.

Authorized Activities
Listing of all new TFOFs, SNARFs, and other activities approved by the committee.
#
Type
SC/TF/WG
Details
5529
SNARFWait Time Waste TFNew Standard: Specification for Measurement of Product Time in Semiconductor Manufacturing
---
SNARFEquipment Training & Documentation TFRevision to SEMI E149-0708, Guide for Equipment Supplier-Provided Documentation for the Acquisition and Use of Manufacturing Equipment
(Note: SNARF will be submitted to the Metrics GCS for approval after the meeting.)
---
SNARFEquipment Training & Documentation TFRevision to SEMI E150-1107, Guide for Equipment Training Best Practices
(Note: SNARF will be submitted to the Metrics GCS for approval after the meeting.)
---
SNARFEMC TFNew Standard: Guide for Semiconductor Manufacturing Facilities Electromagnetic Compatibility (EMC)
(Note: SNARF will be submitted to the Metrics GCS for approval after the meeting.)
Note: SNARFs and TFOFs are available for review on the SEMI Web site at:
http://downloads.semi.org/web/wstdsbal.nsf/TFOFSNARF

Authorized Ballots
Listing of documents approved by the committee for letter ballot.
#
When
SC/TF/WG
Details
---
Cycle 4- 2013Equipment Training & Documentation TFRevision to SEMI E150-1107, Guide for Equipment Training Best Practices


SNARF(s) Granted a One-Year Extension
None.

SNARF(s) Cancelled
None.

Standard(s) to receive Inactive Status
None.

Special Announcements of the Committee (Workshops, Programs, etc.)
None.

Next Meeting
The next N.A. Metrics standards meetings are scheduled in conjunction with SEMICON West 2013 at the San Francisco Marriott Marquis Hotel in San Francisco, California.

*Tentative Schedule*

Monday, July 8*
· EMC TF (3:00 PM – 5:00 PM)


Tuesday, July 9*
· Equipment Training and Documentation TF (9:00 AM - 12:00 PM Noon)

· ESD/ESC TF (3:00 PM – 5:00 PM)

Wednesday, July 10*
· Equipment RAMP Metrics TF (9:00 AM – 12:00 PM Noon)
· Wait Time Waste TF (1:00 PM – 3:00 PM)
· Metrics Committee (3:00 PM - 6:00 PM)

*All times are in PST. Times and dates are subject to change without notice.
Additional meeting details, registration, travel information, and the latest schedule will be updated at http://www.semi.org/node/45276









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