CER - North America Compound Semiconductor Materials Committee Meeting held on 05/15/2013

SEMI International Standards
Standards Locale: North America
Committee: Compound Semiconductor Materials
Place of Meeting: New Orleans, Louisiana
Date of Meeting: 05/15/2013
Meeting End Date: 05/15/2013
Recording SEMI Standards Staff: Michael Tran
CER Posted to Web: 05/23/2013
Leadership Changes

Group	Previous Leader	New Leader
Germanium (Ge) for Photovoltaic (PV) Applications TF	Hani Badawi (AXT)	(disbanded)

TC Chapter Structure Changes
None.

Ballot Results
Passed ballots and line items will be submitted to the ISC Audit & Review Subcommittee for procedural review.
Failed ballots and line items were returned to the originating task forces for re-work and re-balloting.

Document #	Document Title	Committee Action	A&R Forms for Approved Ballots
5544	Revision of SEMI M9.1-96E (Reapproved 0308), Standard for Round 50.8 mm Polished Monocrystalline Gallium Arsenide Wafers for Electronic Device Applications with title change to: Specification for Round 50.8 mm Polished Monocrystalline Gallium Arsenide Wafers for Electronic Device Applications	Passed as balloted. Superclean.
5545	Revision of SEMI M9.2-96E (Reapproved 0308), Standard for Round 76.2 mm Polished Monocrystalline Gallium Arsenide Wafers for Electronic Device Applications with title change to: Specification for Round 76.2 mm Polished Monocrystalline Gallium Arsenide Wafers for Electronic Device Applications	Passed as balloted. Superclean.
5546	Revision of SEMI M9.5-96E (Reapproved 0308), Standard for Round 100 mm Polished Monocrystalline Gallium Arsenide Wafers for Electronic Device Applications with title change to: Specification for Round 100 mm Polished Monocrystalline Gallium Arsenide Wafers for Electronic Device Applications	Passed as balloted. Superclean.
5547	Revision of SEMI M9.6-95E (Reapproved 0308), Standard for Round 125 mm Diameter Polished Monocrystalline Gallium Arsenide Wafers with title change to: Specification for Round 125 mm Diameter Polished Monocrystalline Gallium Arsenide Wafers	Passed as balloted. Superclean.

Ratification Ballot Results
None.

Activities Approved by the GCS between meetings of TC Chapter meeting
None.

Authorized Activities
None.

Authorized Ballots

#	When	SC/TF/WG	Details
4979	Cycle 6 or 7-2013	Gallium Nitride (GaN) TF	New Standard: Specification for Polished Monocrystalline Gallium Nitride Wafers

SNARF(s) Granted a One-Year Extension
None.

SNARF(s) Cancelled
None.

Standard(s) to receive Inactive Status
None.

Special Announcements of the Committee (Workshops, Programs, etc.)
None.

Next Meeting
The next NA Compound Semiconductor Materials Committee Meeting will be a Virtual Meeting via Teleconference and Web sometime during Fall 2013. Exact times and dates are to be determined. Meeting details as they are available will be updated at http://www.semi.org/en/Standards/CalendarEvents

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