SEMI International Standards
| Standards Locale: Europe |
| Committee: Silicon Wafer |
| Place of Meeting: Munich, Germany |
| Date of Meeting: 11/16/2023 |
| Meeting End Date: 11/16/2023 |
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| Recording SEMI Standards Staff: Kevin Nguyen |
| CER Posted to Web: 11/20/2023 |
Leadership Changes
WG/TF/SC/TC Name | Previous Leader | New Leader |
| Int'l Test Methods TF | Peter Wagner (Self) | Thomas Hager (Siltronic) |
| Int'l Terminology TF | Peter Wagner (Self) (stepped down) | TBD |
Committee Structure Changes
None.
Ballot Results
None.
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
# | Type | SC/TF/WG | Details |
| 7162 | SNARF | Int'l Test Methods TF | New Standard: Test Method for epi-resistivity determination in Si wafers by Surface Charge Profiling |
| 7163 | SNARF | Int'l AWG TF | Reapproval of SEMI MF1530-0707 (Reapproved 1018): Test Method for Measuring Flatness, Thickness, and Total Thickness Variation on Silicon Wafers by Automated Noncontact Scanning |
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Authorized Ballots
# | When | TF | Details |
| 7024 | Cycle 9, 1 or 2, 3, 4-2024 | Int'l Polished Wafer TF | Line Item Revision to SEMI M1-0918 Specification for Polished Single Crystal Silicon Wafers ( Diameter tolerance for 300 mm wafers) |
| 7163 | Cycle 9, 1 or 2, 3, 4-2024 | Int'l AWG TF | Reapproval of SEMI MF1530-0707 (Reapproved 1018): Test Method for Measuring Flatness, Thickness, and Total Thickness Variation on Silicon Wafers by Automated Noncontact Scanning |
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
November 15, 2024 in conjunction with SEMICON Europa. Check www.semi.org/standards for the latest update..
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