SEMI International Standards
Standards Locale: North America
Committee: HB-LED
Place of Meeting: SEMI HQ, San Jose, California
Date of Meeting: 10/27/2011
Meeting End Date: 10/27/2011
Recording SEMI Standards Staff: James Amano
CER Posted to Web: 10/31/2011
Leadership Changes
None.
TC Chapter Structure Changes
None.
Ballot Results
None.
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
# | Type | SC/TF/WG | Details |
 | TF | Impurities and Defects in HB-LED Sapphire Wafers Task Force | This Task Force will define and/or measure critical impurities and defects in sapphire waters and the metrology intended to measure them. The Task Force will create standards related to these impurities and defects for use by HB-LED sapphire wafer makers and producers of related devices. |
Authorized Ballots
# | When | SC/TF/WG | Details |
| 5265 | Cycle 1-2012 | HB-LED Wafer TF | New Standard: Specification for 150 mm Diameter Sapphire Wafers for HB-LED Applications |
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
In conjunction with Strategies in Light, Santa Clara, CA, February 7 - 9, 2012.
NA Spring 2012 meetings at SEMI HQ in San Jose, CA, April 2 - 6, 2012.
Details, when available, will be posted to http://www.semi.org/en/Standards/CalendarEvents
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