SEMI International Standards
Standards Locale: Europe
Committee: Compound Semiconductor Materials
Place of Meeting: Nürnberg, Germany
Date of Meeting: 04/17/2012
Meeting End Date: 04/17/2012
Recording SEMI Standards Staff: James Amano
CER Posted to Web: 04/19/2012
Leadership Changes
None.
TC Chapter Structure Changes
None.
Ballot Results
Passed ballots and line items will be submitted to the ISC Audit & Review Subcommittee for procedural review.
Failed ballots and line items were returned to the originating task forces for re-work and re-balloting.
Document # | Document Title | Committee Action | A&R Forms for Approved Ballots |
4618 | New Standard: Test Method for the Carbon Acceptor Concentration in Semi-Insulating Gallium Arsenide Single Crystals by Infrared Absorption Spectroscopy | Passed as balloted. |  |
4809 | Line Item Revisions to SEMI M75-0309, Specifications for Polished Monocrystalline Gallium Antimonide Wafers | | |
LI 1 | Change to section 6.2 | Passed as balloted. | |
LI 2 | Change to table 4 | Passed as balloted. | |
4810 | New Standard: Test Method for Determination of Dislocation Etch Pit Density in Monocrystals of III-V Compound Semiconductors | Passed as balloted. | |
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
None
Authorized Ballots
None.
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None
Next Meeting
October 2012, in Dresden, Germany, in conjunction with SEMICON Europa. Please check http://www.semi.org/Standards/CalendarEvents for details.
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