SEMI International Standards
Standards Locale: Korea
Committee: FPD - Metrology
Place of Meeting: KINTEX, Goyang-si, Korea
Date of Meeting: 10/12/2011
Meeting End Date: 10/12/2011
Recording SEMI Standards Staff: Natalie Shim
CER Posted to Web: 10/18/2011
Leadership Changes
The TF leaders in below stepped down since the TFs were disbanded.
Group | Previous Leader | New Leader |
| Special Contrast Ratio Task Force | Don-Gyou Lee (LG Display) |  |
| Perceptual Motion Blur Task Force | Tae Hee Kim (Samsung Electronic) | |
TC Chapter Structure Changes
None.
Ballot Results
Passed ballots and line items will be submitted to the ISC Audit & Review Subcommittee for procedural review.
Failed ballots and line items were returned to the originating task forces for re-work and re-balloting.
Document # | Document Title | Committee Action | A&R Forms for Approved Ballots |
| 4571E | New Standard: Test Method of PDP Tone and Color Reproduction | Failed |  |
| 4313A | New Standard: Test Method of Backligth Unit Reliability | Failed |  |
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
Listing of all new TFOFs, SNARFs, and other activities approved by the committee.
# | Type | SC/TF/WG | Details |
| TFOF | | Optical Characteristic Measurement Task Force |
| 5336 | SNARF | Optical Characteristic Measurement TF | Test Method for Optical Characteristics of LCD Panel |
| 5337 | SNARF | Optical Characteristic Measurement TF | Test Method for Optical Characteristics of Transparent Display |
Note: SNARFs and TFOFs are available for review on the SEMI Web site at:
http://downloads.semi.org/web/wstdsbal.nsf/TFOFSNARF
Authorized Ballots
Listing of documents approved by the committee for letter ballot.
# | When | SC/TF/WG | Details |
| 4571F | Cycle 1 | Tone & Color TF | New Standard: Test Method of PDP Tone and Color Reproduction |
| 4313B | Cycle 1 | Backlight Measurement TF | New Standard: Test Method of Backlight Unit Reliability Unit for LCD |
| 4859A | Cycle 1 | Backlight Measurement TF | Revision to SEMI D33, Measurement Method of Optical Characteristics for Backlight Unit |
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
1) FPD Seminar (tentative title) will be held on February 8 in conjunction with SEMICON Korea 2012
2) SNARF 5054 was withdrawn since the parent TF, Perceptual Motion Blur, was disbanded.
Next Meeting
Wednesday 7 March, 2012 at SEMI Korea Office, Seoul, Korea
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