SEMI
  HOME
SEMI International Standards
Standards Locale: Japan
Committee: Traceability
Place of Meeting: SEMI Japan Office, Tokyo, Japan
Date of Meeting: 04/23/2013
Meeting End Date: 04/23/2013
Recording SEMI Standards Staff: Hirofumi Kanno
CER Posted to Web: 04/25/2013
Leadership Changes
Japan Anti-Counterfeting Task Force was disbanded.

TC Chapter Structure Changes
None.

Ballot Results

Passed ballots and line items will be submitted to the ISC Audit & Review Subcommittee for procedural review.
Failed ballots and line items were returned to the originating task forces for re-work and re-balloting.
Document #
Document Title
Committee Action
A&R Forms for Approved Ballots
5487New Specification for Basic Protocols to Support the Interoperation of Traceability Systems Necessary for Managing Product Identity throughout the Life Cycle of Objects Using Digital Signatures and Time StampsFailed and returned to the Task Force for re-work.Voting Procedural Sheet for 5487.pdfVoting Procedural Sheet for 5487.pdf




Ratification Ballot Results
None.

Activities Approved by the GCS between meetings of TC Chapter meeting
None.

Authorized Activities

Listing of all new TFOFs, SNARFs, and other activities approved by the committee.
#
Type
SC/TF/WG
Details
5594SNARFJapan PV Traceability Task ForceNew Standard: Guide for Smart Label for PV Traceability
Note: SNARFs and TFOFs are available for review on the SEMI Web site at:
http://downloads.semi.org/web/wstdsbal.nsf/TFOFSNARF



Authorized Ballots
None.

SNARF(s) Granted a One-Year Extension
None.

SNARF(s) Cancelled
None.

Standard(s) to receive Inactive Status
None.

Special Announcements of the Committee (Workshops, Programs, etc.)
None.

Next Meeting
The next Japan Traceability Commitee meeting is scheduled for August 6, 2013, 1:00p.m. - 3:00p.m. at JPR Buliding Conference Room1, SEMI Japan Office, Tokyo, Japan.









Copyright © 2008 Semiconductor Equipment and Materials International (SEMI®).
All rights reserved.