SEMI International Standards
Standards Locale: North America
Committee: Automated Test Equipment
Place of Meeting: SEMI Headquarters in San Jose, California
Date of Meeting: 10/26/2011
Meeting End Date: 10/26/2011
Recording SEMI Standards Staff: Paul Trio
CER Posted to Web: 11/08/2011
Leadership Changes
None.
TC Chapter Structure Changes
None.
Ballot Results
Passed ballots and line items will be submitted to the ISC Audit & Review Subcommittee for procedural review.
Failed ballots and line items were returned to the originating task forces for re-work and re-balloting.
Document # | Document Title | Committee Action | A&R Forms for Approved Ballots |
4782C | New Standard: Specification for Standard Test Data Format (STDF) Memory Fail Datalog | Passed as balloted. |  |
5275 | Reapproval of SEMI G79-0200, Specification for Overall Digital Timing Accuracy | Passed as balloted. Superclean |  |
5276 | Reapproval of SEMI G80-0200, Test Method for the Analysis of Overall Digital Timing Accuracy for Automated Test Equipment | Passed as balloted. Superclean |  |
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
None.
Authorized Ballots
None.
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
Wednesday, March 14, 2012 (tentative)
In conjunction with the SEMI CAST face-to-face meeting
SEMI Headquarters
3081 Zanker Road
San Jose, California 95134
U.S.A.
The exact time, date, and location of this meeting will be announced when finalized.
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