SEMI International Standards
Standards Locale: Europe
Committee: Photovoltaic (PV) - Automation
Place of Meeting: Dresden, Germany
Date of Meeting: 10/11/2011
Meeting End Date: 10/11/2011
Recording SEMI Standards Staff: James Amano
CER Posted to Web: 10/20/2011
Leadership Changes
None.
TC Chapter Structure Changes
None.
Ballot Results
Document # | Document Title | Committee Action | A&R Forms for Approved Ballots |
| 5074 | New Standard: Specification for Front Surface Marking of PV Silicon Wafers with Two-Dimensional Matrix Symbols | Approved as balloted |  |
| 5152 | New Standard: Specification for Marking of PV Silicon Brick Face and PV Wafer Edge | Approved as balloted | |
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
# | Type | SC/TF/WG | Details |
| 5338 | SNARF | PV Traceability TF | Practice for Assigning Identification Numbers to PV Silicon Wafer and Solar Cell Manufacturers |
| 5339 | SNARF | PV EIS TF | Specification for Single Material Tracking and Tracing For Crystalline Silicon PV |
Authorized Ballots
# | When | SC/TF/WG | Details |
| 5338 | Cycle 1-2012 or Cycle 2-2012 | PV Traceability TF | Practice for Assigning Identification Numbers to PV Silicon Wafer and Solar Cell Manufacturers |
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
In conjunction with the with PV Fab Managers Forum, March 25 - 27, 2012 in Berlin, Germany. Check http://www.pvgroup.org/Standards for exact dates and times.
|