SEMI International Standards Committee Express Report
| Standards Region: Japan |
| Committee: Traceability |
| Place of Meeting: Makuhari Messe |
| Date of Meeting: 12/07/2011 |
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| Recording SEMI Standards Staff: Hirofumi Kanno |
| CER Posted to Web: 12/22/2011 |
Leadership Changes in the Committee
Group | Previous Leader | New Leader |
| Japan PV Traceability Task Force |  | Hirokazu Tsunobuchi / Keyence |
 | Yoichi Iga / Renesas Electronics |
Technical Ballot Actions
None.
New Committee or Task Force Activities
# | Type | SC/TF/WG | Details |
 | TFOF |  | Japan PV Traceability Task Force |
| 5361 | SNARF | 5 Year Review TF | Reapproval of SEMI T17-0706, Specification of Substrate Traceability |
| 5362 | SNARF | 5 Year Review TF | Reapproval of SEMI T18-1106, Specification of Parts and Components Traceability |
| 5365 | SNARF | JIG and Unit Package ID TF | Revision to T15-0705, General Specification of Jig ID: Concept |
| XXXX | SNARF | JIG and Unit Package ID TF | Revision of G83: Specification for Bar Code Marking of Product Packages; add 83.1 for Reduce Space Marking of Product Packages |
Technical Ballots Expected for Review at the Next Committee Meeting
# | When | SC/TF/WG | Details |
| 5361 | Cycle2 | 5 Year Review TF | Reapproval of SEMI T17-0706, Specification of Substrate Traceability |
| 5362 | Cycle2 | 5 Year Review TF | Reapproval of SEMI T18-1106, Specification of Parts and Components Traceability |
| 5365 | Cycle2 | JIG and Unit Package ID TF | Revision to T15-0705, General Specification of Jig ID: Concept |
| XXXX | Cycle2 | JIG and Unit Package ID TF | Revision of G83: Specification for Bar Code Marking of Product Packages; add 83.1 for Reduce Space Marking of Product Packages |
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
The next Japan Traceability Committee meeting is schedule for 26th of April, 2012 at SEMI Japan office, Tokyo.
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