SEMI International Standards Committee Express Report

Standards Region: North America
Committee: Photovoltaic (PV) - Materials
Place of Meeting: SEMI HQ, San Jose, California
Date of Meeting: 10/31/2012
Recording SEMI Standards Staff: Kevin Nguyen
CER Posted to Web: 11/02/2012


Leadership Changes in the Committee

Group
Previous Leader
New Leader
PV Gas and Liquid Chemicals Purity TF was disbanded
PV Minority Carrier Lifetime WG was merged with PV Electrical and Optical Measurement TF
Technical Ballot Actions

Document #
Document Title
Committee Action
A&R Forms for Approved Ballots
4675B
New Standard: Test Method for the Measurement of Elemental Impurity Concentrations in Silicon Feedstock for Silicon Solar Cells By Bulk Digestion, Inductively Coupled-Plasma Mass SpectrometryFailed
4675BFailed.pdf
5438
New Standard: Test Method for the Measurement of Oxygen Concentration in PV Silicon Materials for Silicon Solar Cells by Inert Gas Fusion Infrared Detection MethodApproved as balloted
5438ProceduralReview.pdf
5436
Auxiliary Information on Round Robin Report for SEMI PV10 Test Method for Instrumental Neutron Activation Analysis (INAA) of SiliconApproved5436ProceduralReview.pdf


New Committee or Task Force Activities

#
Type
SC/TF/WG
Details
5501
SNARFInt'l PV Analytical Test Methods TFAuxiliary document to include interlaboratory study for document 5438- Test Method For The Measurement Of Oxygen Concentration In PV Silicon Materials For Silicon Solar Cells By Inert Gas Fusion Infrared Detection Method
5502
SNARFPV Silicon Materials TFLine item Revision to SEMI PV39: Test Method For In-Line Measurement Of Cracks In Pv Silicon Wafers By Dark Field Infrared Imaging


Technical Ballots Expected for Review at the Next Committee Meeting

#
When
SC/TF/WG
Details
4675C
Cycle 1-2013Int'l PV Analytical Test Methods TFNew Standard: Test Method for the Measurement of Elemental Impurity Concentrations in Silicon Feedstock for Silicon Solar Cells By Bulk Digestion, Inductively Coupled-Plasma Mass Spectrometry
5439
Cycle 1-2013Int'l PV Analytical Test Methods TFLine Item Revision to SEMI PV13-1110, Test Method for Contactless Excess-Charge-Carrier Recombination Lifetime Measurement in Silicon Wafers, Ingots, and Bricks Using an Eddy-Current Sensor
5502
Cycle 1-2013PV Silicon Materials TFLine item Revision to SEMI PV39, Test Method For In-Line Measurement Of Cracks In PV Silicon Wafers By Dark Field Infrared Imaging
5439
Cycle 1-2013PV Silicon Materials TFLine item revision to SEMI PV40, Test Method for In-Line Measurement of Saw Marks on PV Silicon Wafers by a Light Sectioning Technique Using Multiple Line Segments


Special Announcements of the Committee (Workshops, Programs, etc.)
Document 5438 - Test Method For The Measurement Of Oxygen Concentration In PV Silicon Materials For Silicon Solar Cells By Inert Gas Fusion Infrared Detection Method, was recently approved. A round robin testing is being conduct to validate these methods. Participating company is invited. Contact Patrick Schnabel from Evans Analytical at pschnabel@eaglabs.com or Kevin Nguyen from SEMI at knguyen@semi.org for details.

Next Meeting
The next meeting will be in conjunction with NA Spring Standards Meetings in San Jose, California at SEMI HQ. The committee will meet on Wednesday, April 3, 2013. Check www.semi.org/standards on calendar of event for the latest schedule.