SEMI International Standards
Standards Locale: North America |
Committee: Photovoltaic (PV) - Materials |
Place of Meeting: SEMI HQ, San Jose, California |
Date of Meeting: 10/31/2012 |
Meeting End Date: 10/31/2012 |
|
Recording SEMI Standards Staff: Kevin Nguyen |
CER Posted to Web: 11/02/2012 |
Leadership Changes
Group | Previous Leader | New Leader |
PV Gas and Liquid Chemicals Purity TF was disbanded | | |
PV Minority Carrier Lifetime WG was merged with PV Electrical and Optical Measurement TF | | |
Committee Structure Changes
None.
Ballot Results
Document # | Document Title | Committee Action | A&R Forms for Approved Ballots |
4675B | New Standard: Test Method for the Measurement of Elemental Impurity Concentrations in Silicon Feedstock for Silicon Solar Cells By Bulk Digestion, Inductively Coupled-Plasma Mass Spectrometry | Failed | |
5438 | New Standard: Test Method for the Measurement of Oxygen Concentration in PV Silicon Materials for Silicon Solar Cells by Inert Gas Fusion Infrared Detection Method | Approved as balloted | |
5436 | Auxiliary Information on Round Robin Report for SEMI PV10 Test Method for Instrumental Neutron Activation Analysis (INAA) of Silicon | Approved | |
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
# | Type | SC/TF/WG | Details |
5501 | SNARF | Int'l PV Analytical Test Methods TF | Auxiliary document to include interlaboratory study for document 5438- Test Method For The Measurement Of Oxygen Concentration In PV Silicon Materials For Silicon Solar Cells By Inert Gas Fusion Infrared Detection Method |
5502 | SNARF | PV Silicon Materials TF | Line item Revision to SEMI PV39: Test Method For In-Line Measurement Of Cracks In Pv Silicon Wafers By Dark Field Infrared Imaging |
Authorized Ballots
# | When | SC/TF/WG | Details |
4675C | Cycle 1-2013 | Int'l PV Analytical Test Methods TF | New Standard: Test Method for the Measurement of Elemental Impurity Concentrations in Silicon Feedstock for Silicon Solar Cells By Bulk Digestion, Inductively Coupled-Plasma Mass Spectrometry |
5439 | Cycle 1-2013 | Int'l PV Analytical Test Methods TF | Line Item Revision to SEMI PV13-1110, Test Method for Contactless Excess-Charge-Carrier Recombination Lifetime Measurement in Silicon Wafers, Ingots, and Bricks Using an Eddy-Current Sensor |
5502 | Cycle 1-2013 | PV Silicon Materials TF | Line item Revision to SEMI PV39, Test Method For In-Line Measurement Of Cracks In PV Silicon Wafers By Dark Field Infrared Imaging |
5439 | Cycle 1-2013 | PV Silicon Materials TF | Line item revision to SEMI PV40, Test Method for In-Line Measurement of Saw Marks on PV Silicon Wafers by a Light Sectioning Technique Using Multiple Line Segments |
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
Document 5438 - Test Method For The Measurement Of Oxygen Concentration In PV Silicon Materials For Silicon Solar Cells By Inert Gas Fusion Infrared Detection Method, was recently approved. A round robin testing is being conduct to validate these methods. Participating company is invited. Contact Patrick Schnabel from Evans Analytical at pschnabel@eaglabs.com or Kevin Nguyen from SEMI at knguyen@semi.org for details.
Next Meeting
The next meeting will be in conjunction with NA Spring Standards Meetings in San Jose, California at SEMI HQ. The committee will meet on Wednesday, April 3, 2013. Check www.semi.org/standards on calendar of event for the latest schedule.
Copyright ©2024 Semiconductor Equipment and Materials International (SEMI®). All rights reserved.