SEMI International Standards
Standards Locale: Europe
Committee: Photovoltaic
Place of Meeting: DAS Environmental Expert, Dresden, Germany
Date of Meeting: 10/11/2011
Meeting End Date: 10/11/2011
Recording SEMI Standards Staff: Kevin Nguyen
CER Posted to Web: 10/23/2011
Leadership Changes
None
TC Chapter Structure Changes
None.
Ballot Results
Passed ballots and line items will be submitted to the ISC Audit & Review Subcommittee for procedural review.
Failed ballots and line items were returned to the originating task forces for re-work and re-balloting.
Document # | Document Title | Committee Action | A&R Forms for Approved Ballots |
| 5226 | Line Items Revision to PV17-0611, Specification for Virgin Silicon Feedstock Materials for Photovoltaic Applications |  |  |
| Line Item 1 | Add to line 4.3 of Table 1 | Passed | |
| Line Item 2 | Add section 2.6, section 4.1, and delete Related Information 1 | Passed | |
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
# | Type | SC/TF/WG | Details |
| TFOF | PV Silicon Materials TF | TFOF's charter was updated to expand scope for writing standardized test methods |
| 5330 | SNARF | PV Silicon Materials TF | New Standard: Test Method for In-Line Measurement of Micro Cracks of PV Silicon Wafers by Infrared Imaging |
| 5331 | SNARF | PV Silicon Materials TF | New Standard: Test Method for In-Line Measurement of Saw Marks on PV Silicon Wafers by a Light Sectioning Technique |
| 5332 | SNARF | PV Silicon Materials TF | New Standard: Test Method for In-Line Measurement of Thickness and Thickness Variation of Silicon Wafers for PV Applications |
| 5333 | SNARF | PV Silicon Materials TF | New Standard: Test Method for In-Line Measurement of Waviness on PV Silicon Wafers by a Light Sectioning Technique |
| 5334 | SNARF | PV Ribbon TF | Revision of SEMI PV18-0811, Guide for Specifying a Photovoltaic Connector Ribbon |
| 5335 | SNARF | PV Ribbon TF | Revision of SEMI PV19-0811, Guide for Testing Photovoltaic Connector Ribbon Characteristics |
.
Authorized Ballots
# | When | SC/TF/WG | Details |
| 5331 | Cycle 1-2012 | PV Silicon Materials TF | New Standard: Test Method for In-Line Measurement of Saw Marks on Pv Silicon Wafers by a Light Sectioning Technique |
| 5332 | Cycle 1-2012 | PV Silicon Materials TF | New Standard: Test Method for In-Line Measurement of Thickness and Thickness Variation of Silicon Wafers for PV Applications |
| 5334 | Cycle 1-2012 | PV Ribbon TF | Revision of SEMI PV18-0811, Guide for Specifying a Photovoltaic Connector Ribbon |
| 5335 | Cycle 1-2012 | PV Ribbon TF | Revision of SEMI PV19-0811, Guide for Testing Photovoltaic Connector Ribbon Characteristics |
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
None.
Next Meeting
The next meeting is tentatively scheduled for PV Fab Managers Forum in March 27-28, Berlin Germany. Check www.semi.org/standards for latest update.
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