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SEMI International Standards Committee Express Report

Standards Region: North America

Committee: Photovoltaic

Place of Meeting: Sheraton-San Jose, Milpitas, CA

Date of Meeting: 04/01/2009

Recording SEMI Standards Staff: Kevin Nguyen

CER Posted to Web:

Document#	Document Title	Committee Action	A&R Forms for Approved Ballots
4674	Line Items Revision to SEMI PV1-0309 - Test Method For Measuring Trace Elements In Photovoltaic-Grade Silicon By High-Mass Resolution Glow Discharge Mass Spectrometry	See Below
Line Item 1	Change the word in the title from PHOTOVOLTAIC-GRADE SILICON to SILICON FEEDSTOCK FOR SILICON SOLAR CELLS	Passed as balloted
Line Item 2	Delete “PV” in Sections 1.2, 2.1, 2.6.3, 2.6.4, 2.6.5, 2.6.6, 2.6.7, 2.6.8, and 3.3.	Passed with editorial changes
Line Item 3	Change “photovoltaic-grade (PV) silicon” to “silicon feedstock” in Section 1.1, and “PV silicon” to “silicon feedstock” in Sections 1.3, 2.1, 2.3, 2.4, title of Table 1 and in the Note of Table 1.	Passed as balloted
Line Item 4	Delete “such as PV silicon feedstock” in 1.3	Passed with editorial changes
Line Item 5	Change “PV Si Feedstock or Solar Grade Silicon” to “Si Feedstock” in 5.2.2	Passed as balloted
Line Item 6	Change “PV silicon, solar grade silicon, high purity” to “Silicon solar cells” in 18.1	Passed as balloted

1. Doc. 4738, New Standard: Test Methods for Minority Carrier Lifetime in Silicon Wafers and Ingots
2. Revision of SEMI MF1535-0707 - Test Method for Carrier Recombination Lifetime in Silicon Wafers by Noncontact Measurement of Photoconductivity Decay by Microwave Reflectance