SEMI International Standards
Standards Locale: North America
Committee: Photovoltaic (PV) - Materials
Place of Meeting: Moscone Center, San Francisco, CA
Date of Meeting: 07/11/2012
Meeting End Date: 07/11/2012
Recording SEMI Standards Staff: Kevin Nguyen
CER Posted to Web: 07/18/2012
Leadership Changes
Group | Previous Leader | New Leader |
| PV Materials Committee | Dick Hockett (Evans Analytical Group) | John Valley (MEMC) |
| Int'l Analytical Test Methods TF |  | Hugh Gotts (Air Liquide) |
TC Chapter Structure Changes
None.
Ballot Results
Document # | Document Title | Committee Action | A&R Forms for Approved Ballots |
5158A | New Standard: Specification for Anti-Reflective-Coated Glass, Used in Crystalline Silicon Photovoltaic Modules | Failed and reballot | |
5242A | New Standard: Guide for Fluorine (F2), Used In Photovoltaic Applications | Passed as balloted | |
5156A | New Standard: Specifications for Hydrogen Peroxide, Used In Photovoltaic Applications | Passed as balloted |  |
5391 | Auxiliary Information: Research Report On Interlaboratory Study To Establish Precision Statements For SEMI PV13, Test Method For Contactless Excess-Charge-Carrier Recombination Lifetime Measurement In Silicon Wafers, Ingots, And Bricks Using An Eddy-Current Sensor | Approved | |
Ratification Ballot Results
None.
Activities Approved by the GCS between meetings of TC Chapter meeting
None.
Authorized Activities
# | Type | SC/TF/WG | Details |
5394 | SNARF | PV Electrical and Optical Measurement TF | New Standard:Test Method for QSS Microwave PCD Measurements of Carrier Decay and Lifetime (SNARF was revised) |
5435 | SNARF | Int'l PV Analytical Test Methods TF | Auxiliary Information to include interlaboratory study for SEMI PV25-1011 - Test Method for Simultaneously Measuring Oxygen, Carbon, Boron And Phosphorus in Solar Silicon Wafers and Feedstock by Secondary Ion Mass Spectrometry |
5436 | SNARF | Int'l PV Analytical Test Methods TF | Auxiliary Information: Results of Round Robin for SEMI PV10-Test Method for Instrumental Neutron Activation Analysis (INAA) of Silicon |
5437 | SNARF | Int'l PV Analytical Test Methods TF | Line item revision of SEMI PV25-1011 - Test Method for Simultaneously Measuring Oxygen, Carbon, Boron And Phosphorus in Solar Silicon Wafers and Feedstock by Secondary Ion Mass Spectrometry |
5438 | SNARF | Int'l PV Analytical Test Methods TF | New Standard: Test Method for the Measurement of Oxygen Concentration in PV Silicon Materials by Inert Gas Fusion Infrared Detection Method |
5440 | SNARF | Int'l PV Analytical Test Methods TF | Revision to SEMI PV10-1110: Test Method for Instrumental Neutron Activation Analysis (INAA) of Silicon |
5439 | SNARF | Int'l PV Analytical Test Methods TF | Revision to SEMI PV13-1110 Test Method for Contactless Excess-Charge-Carrier Recombination Lifetime Measurement in Silicon Wafers, Ingots, and Bricks Using an Eddy-Current Sensor |
Authorized Ballots
# | When | SC/TF/WG | Details |
5158B | Cycle 5 or 6 | PV Materials Committee | New Standard: Specification for Anti-Reflective-Coated Glass, Used in Crystalline Silicon Photovoltaic Modules |
4675B | Cycle 5 or 6 | Int'l PV Analytical Test Methods TF | New Standard: Test Method for the Measurement of Elemental Impurity Concentrations in Silicon Feedstock for Silicon Solar Cells By Bulk Digestion, Inductively Coupled-Plasma Mass Spectrometry |
5439 | Cycle 6 | Int'l PV Analytical Test Methods TF | Revision to SEMI PV13-1110 Test Method for Contactless Excess-Charge-Carrier Recombination Lifetime Measurement in Silicon Wafers, Ingots, and Bricks Using an Eddy-Current Sensor |
5438 | Cycle 5 | Int'l PV Analytical Test Methods TF | New Standard: Test Method for the Measurement of Oxygen Concentration in PV Silicon Materials by Inert Gas Fusion Infrared Detection Method |
SNARF(s) Granted a One-Year Extension
None.
SNARF(s) Cancelled
None.
Standard(s) to receive Inactive Status
None.
Special Announcements of the Committee (Workshops, Programs, etc.)
Several seminars on SEMI Standards related to Horizontal Communication between PV Equipment and others are being planned at PVJapan in December 5-7, 2012, Makuhari Meese, Japan. For detail and registration, please visit
http://www.pvjapan.org/en/sessions/seminars
Next Meeting
The next meeting will be in conjunction with NA Fall Standards Meetings in San Jose, California at SEMI HQ. The committee will meet on Wednesday, October 31, 2012 at 1:00 PM-4:00 PM. Check www.semi.org/standards on calendar of event for the latest schedule.
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