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SEMI International Standards
Standards Locale: Japan
Committee: 3D Packaging and Integration
Place of Meeting: SEMI Japan/ OVTCCM
Date of Meeting: 03/09/2026
Meeting End Date: 03/09/2026
Recording SEMI Standards Staff: Akiko Yoshida
CER Posted to Web: 03/13/2026
Leadership Changes

WG/TF/SC/TC Name
Previous Leader
New Leader
3D Packaging & Integration 5 Year Review TFMasahiro Tsuriya (iNEMI)N/A


TC Chapter Structure Changes

Previous WG/TF/SC Name
New WG/TF/SC Name or Status Change
Steering Working GroupDisbanded
Wafer Bonding Pressure Evaluation TFWafer Surface Pressure Mapping by Pressure Measurement Film Task Force (TF name is changed)


Ballot Results

Document #
Document Title
TC Chapter Action
A&R Forms for Approved Ballots
7398New Standard: Test Method for Wafer Bond Strength Measurement by Double-Cantilever BeamPassed with Editorial Changes7398_Ballot Review.pdf7398_Ballot Review.pdf
Note 1: Passed ballots and line items will be submitted to the ISC Audit & Review Subcommittee for procedural review.

Note 2: Failed ballots and line items were returned to the originating task forces for re-work and re-balloting or abandoning.


Ratification Ballot Results
None.

Activities Approved by the GCS between meetings of TC Chapter meeting
None.

Authorized Activities
Listing of all revised or new SNARF(s) approved by the Originating TC Chapter.
#
Type
SC/TF/WG
Details
7460SNARF3D Packaging & Integration 5-Year Review TFLine Item Revision to SEMI G82-1115, SPECIFICATION FOR 300 mm LOAD PORT FOR FRAME CASSETTES IN BACKEND PROCESS
7461SNARF3D Packaging & Integration 5-Year Review TFLine Item Revision to G95-1120, SPECIFICATION FOR MECHANICAL FEATURES OF 450 mm LOAD PORT FOR TAPE FRAME CASSETTES IN THE BACKEND PROCESS
7462SNARF3D Packaging & Integration 5-Year Review TFLine Item Revision to SEMI G74-0699 (Reapproved 1020), SPECIFICATION FOR TAPE FRAME FOR 300 mm WAFERS
7463SNARF3D Packaging & Integration 5-Year Review TFLine Item to SEMI G87-1108 (Reapproved 1020), SPECIFICATION FOR PLASTIC TAPE FRAME FOR 300 mm WAFER
TFOFWafer Surface Pressure Mapping by Pressure Measurement Film TFRevise TFOF to change the TF name
From: Wafer Bonding Pressure Evaluation Task Force
To: Wafer Surface Pressure Mapping by Pressure Measurement Film Task Force
7464SNARFWafer Surface Pressure Mapping by Pressure Measurement Film TFNew Standard: Guide for Using Pressure Measurement Film for Wafer Surface Pressure Mapping in Equipment Alignment Processes
Note 1: SNARFs and TFOFs are available for review on the SEMI Web site at:

http://downloads.semi.org/web/wstdsbal.nsf/TFOFSNARF

Authorized Ballots
Listing of documents authorized by the Originating TC Chapter for Letter Ballot.
#
When
TF
Details
7460Cycle 4, 20263D Packaging & Integration 5-Year Review TFLine Item Revision to SEMI G82-1115, SPECIFICATION FOR 300 mm LOAD PORT FOR FRAME CASSETTES IN BACKEND PROCESS
7461Cycle 4, 20263D Packaging & Integration 5-Year Review TFLine Item Revision to G95-1120, SPECIFICATION FOR MECHANICAL FEATURES OF 450 mm LOAD PORT FOR TAPE FRAME CASSETTES IN THE BACKEND PROCESS
7462Cycle 5, 20263D Packaging & Integration 5-Year Review TFLine Item Revision to SEMI G74-0699 (Reapproved 1020), SPECIFICATION FOR TAPE FRAME FOR 300 mm WAFERS
7463Cycle 5, 20263D Packaging & Integration 5-Year Review TFG87-1108 (Reapproved 1020), SPECIFICATION FOR PLASTIC TAPE FRAME FOR 300 mm WAFER


SNARF(s) Granted a One-Year Extension
None.

SNARF(s) Cancelled
None.

Standard(s) to receive Inactive Status
None.

Special Announcements of the Committee (Workshops, Programs, etc.)
None.

Next Meeting
The next meeting is scheduled for Friday, June 5, 2026 2:00 PM - 4:00 PM JST via OVTCCM and at SEMI Japan Office, Tokyo, Japan (Hybrid).









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